The AD1876 is a 16-bit serial output sampling A/D converter which uses a switched capacitor/charge redistribution architecture to achieve a 100 kSPS conversion rate (10 ms total conversion time). Overall performance is optimized by digitally correcting internal nonlinearities through on-chip autocalibration.
The circuitry of the AD1876 is partitioned onto two monolithic chips, a digital control chip fabricated with Analog Devices'DSP CMOS process and an analog ADC chip fabricated with the BiMOS II process. Both chips are contained in a single package.
The serial output interface requires an external clock and sample command signal. The output data rate may be as high as 2.08 MHz, and is controlled by the external clock. The twos complement format of the output data is MSB first and is directly compatible with the NPC SM5805 digital decimation filter used in consumer audio products. The AD1876 is also compatible with a variety of DSP processors.
The AD1876 is packaged in a space saving 16-pin plastic DIP and operates from +5 V and ±12 V supplies; typical power consumption is 235 mW. The digital supply (VDD) is isolated from the linear supplies (VEE and VCC) for reduced digital crosstalk. Separate analog and digital grounds are also provided.
VCC to VEE . . . . . . . . . . . . . . . . . . . . . . . . . . 0.3 V to +26.4 V
VDD to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.3 V to +7 V
VCC to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.3 V to +18 V
VEE to AGND . . . . . . . . . . . . . . . . . . . . . . . .. . . 18 V to +0.3 V
AGND to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±0.3 V
Digital Inputs to DGND . . . . . . . . . . . . . . . . . . . . . . . 0 V to 5.5 V
Analog Inputs, VREF to AGND . . . . (VCC + 0.3 V) to(VEE 0.3 V)
Soldering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +300°C, 10 sec
Storage Temperature . . . . . . . . . . . . . . . . . . 60°C to +100°C
*Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those
indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
Required Field 
